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Tenders

Metrology SEM+FIB system

Open
Deadline
33 days left
September 07, 2026
Contract Details
Category
Other
Reference
604044
Value
€1,300,000
Location
Netherlands
Published
July 29, 2026
CPV Code
Project Timeline

Tender Published

July 28, 2026

Deadline for Questions

August 31, 2026

Submission Deadline

September 07, 2026

Budget
€1,300,000
Duration
Not specified
Location
Netherlands
Type
Other

Original Tender Description

The main purpose of this FIB/SEM equipment is to perform material milling (cutting), 3D characterization, and cross section analysis of epitaxially grown InP, InGaAs, InAlGaAs and InGaAsP layers on InP substrates. The structures may also contain polymer-based planarization layers, SiOx or SiNx dielectric layers and TiPtAu or NiGeAu metal layers.
EU Funded

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Basic Requirements

  • EU funding compliance required

Documents

5 documents available with AI summaries

TN604044 - EF16 Aankondiging van een opdracht - algemene richtlijn, standaardreg...DOC
TN604044 - EF16 Aankondiging van een opdracht... -- 198.7 KB

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Part ADOC
Part A -- 3.6 MB

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Part BDOC
Part B -- 192.8 KB

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Part CDOC
Part C -- 873.5 KB

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Public Tender Metrology SEM+FIBDOC
Public Tender Metrology SEM+FIB -- 880.8 KB

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